AMAST Mail 1996
[Prev][Next][Index]
ETW'97: IEEE European Test Workshop - Call for papers.
-
Subject: ETW'97: IEEE European Test Workshop - Call for papers.
-
From: prinetto@chiusella.polito.it (Paolo Prinetto)
-
Date: Mon, 14 Oct 1996 15:29:50 +0100
-
Apparently-To: amast@cs.utwente.nl
Please find enclosed the call for papers for ETW'97: IEEE European Test Workshop.
This call and other information on ETW'97 are also accessible by WWW at
http:\\www.polito.it\etw97.
We sincerely apologize if you receive more than one copy of this message.
Kindly forward this Announcement to your colleagues.
For duplications and requests for removal from this list,
please send mail to <paolo.prinetto@polito.it>.
****************************************************************************
ETW'97 IEEE European Test Workshop
Cagliari (Grand Hotel Chia Laguna), Italy
May 28 - 30, 1997
The IEEE European Test Workshop is a well-recognized forum for presenting
and discussing trends and hot topics in the area of electronic circuit and
system testing. The Workshop provides the ideal environment for cross-fertilizing
industrial and academic experiences and needs. You are all invited to submit your
contributions to ETW'97, which moves from Montpellier to another nice seaside
resort in the Mediterranean area. The topics include but are not limited to:
- Test Automation
- DFT and BIST
- ATPG and Fault Simulation
- IDDQ Testing
- ATE
- Application-Driven System Test
- Synthesis for Testability
- Online Test
- Defect Analysis
- Mixed-Signal and Analog Testing
- Test Quality and Test Economics.
The program committee invites original presentations in these areas.
Each submission should include a 50-word abstract and a list of keywords,
and may be a full paper or an extended summary. Also identify a contact author
and include a complete mailing address, phone number, fax number and E-mail address.
Submitted materials may be included in an informal workshop compendium of papers.
Best contributions will be selected for publication in a special issue of the
Journal of Electronic Testing: Theory and Applications (JETTA), published by Kluwer.
If you wish to submit a presentation, please observe the following deadlines:
* Submission deadline: March 1, 1997
* Notification of acceptance: April 15, 1997
Submit paper proposals to:
ETW'97 Secretariat
Politecnico di Torino
Dip. Automatica e Informatica
Corso Duca degli Abruzzi, 24
I-10129 Torino
Italy
Phone: +39 11 564.7043
Fax: +39 11 564.7099
E-mail: etw97@polito.it
For general information, contact:
Paolo Prinetto
Politecnico di Torino
Dip. Automatica e Informatica
Corso Duca degli Abruzzi, 24
I-10129 Torino
Italy
Phone: +39 11 564.7007
Fax: +39 11 564.7099
E-mail: paolo.prinetto@polito.it
The ETW'97 is sponsored by the IEEE Computer Society Test Technology Technical
Committee, in cooperation with the European group of the Test Technology Technical
Committee (ETTTC).
Daily flights connect most European airports to Cagliari. A shuttle service will
be provided from Cagliari airport to the Grand Hotel Chia Laguna.
For further information, please visit the ETW'97 internet web page at
http:\\www.polito.it\etw97
------------------------------------------------------------------------
General Chair
P. Prinetto
Politecnico di Torino (Italy)
General Co-Chair
T. W. Williams
IBM (USA)
General Vice Chair
J. Figueras
University of Catalunya (Spain)
Program Chair
H. J. Wunderlich
University of Siegen (Germany)
Program Co-Chair
B. Bennetts
LogicVision (United Kingdom)
Finance Chair
M. Sonza Reorda
Politecnico di Torino (Italy)
Local Arrangements Chair
A. Benso
Politecnico di Torino (Italy)
Publicity Chair
C. Landrault
LIRMM (France)
Program Committee
E.J. Aas - Univ. of Trondheim (NL)
K. Baker - Philips (NL)
S. Barbagallo - Italtel (I)
B. Becker - Univ. of Freiburg (D)
G. Carlsson - Ericsson (S)
M. Croft - Mentor Graphics (UK)
B. Courtois - TIMA CMP (F)
W. Daehn - SICAN GmbH (D)
C. Ellingham - Synopsys (USA)
J. Figueras - Univ. of Catalunya (E)
H. Fujiwara - NAIST (J)
C. Gauthron - Compass (F)
S. Griep - Siemens (D)
J. Hlavicka - Univ. of Czech (CZ)
A. Hlawiczka - Univ. of Gliwice (PL)
H. Kerkhoff - Univ. of Twente (NL)
G. Krueger - SNI (D)
C. Landrault - LIRMM (F)
C. Lopez Barrio - Telefonica I+D (E)
D. Medina - Italtel (I)
H. Manhaeve - KIHWV (B)
M. Nicolaidis - TIMA CMP (F)
P. Olivo - Univ. di Ferrara (I)
A. Paschalis - NCSR (GR)
Z. Peng - Univ. of Linkoping (S)
P. Prinetto - Politecnico di Torino (I)
M. Renovell - LIRMM (F)
R. Segers - Philips Semiconductors (NL)
J.P. Teixeira - INESC (P)
R. Ubar - Univ. of Tallinn (EE)
R. Wagner - Bosch (D)
T. W. Williams - IBM (USA)
V. Yarmolik - Univ. of Minsk (BY)
Y. Zorian - Lucent Bell Labs (USA)
****************************************************************************
[
AMAST Mail 1996
|
Latest Update |
AMAST Mail Meta-Index |
AMAST
]